KLA Tencor 073-805314-00 driver board

KLA Tencor 073-805314-00 driver board

Product Details Introduction

KLA Tencor 073-805314-00 Driver Board - Product Application Field Detailed Explanation

1、 Basic Product Information

The KLA Tencor 073-805314-00 driver board, also known as BCB IIb Board Assembly, is a commonly used circuit driver control module in KLA Tencor wafer inspection and testing systems (such as P-8 probe stations). It mainly undertakes the driving tasks of motors, positioning devices, and detection devices, and is an indispensable functional component in the equipment.

2、 Product application areas

1. Wafer Testing and Probe Systems

The driver board is used to control the precise movement of the probe system, achieve precise docking between the probe and the wafer electrode, and support high-precision electrical testing.

Commonly used in probe stations such as P-8 and P-20 series for automated positioning and alignment before wafer testing.

2. Precision motors and multi axis system control

This driver board supports multi axis linkage and can synchronously control multiple servo motors to ensure that all components work together during wafer inspection.

Provide stable speed, acceleration control, and position calibration, especially suitable for systems that require high-precision repetitive positioning.

3. Motion control of image acquisition platform

The driver board can also be used for scanning platform control of image recognition modules, supporting high-speed movement and low shake control to ensure clear and complete image acquisition data.

4. Automated Vehicle Loading System (Wafer Handling)

In the wafer loading and unloading process of the equipment, this drive board can be used to control the movement process of vacuum suction cups, robotic arms, rotating platforms, etc., achieving fast and stable wafer transfer operations.

5. Industrial site reliability control

The driver board adopts industrial grade design standards and has characteristics such as anti-interference, high temperature tolerance, and long-term continuous operation, which can adapt to the challenges of dust, electromagnetic interference, and temperature and humidity changes in the semiconductor manufacturing environment.

3、 Summary of functional features

High precision motion control capability meets the high requirements of semiconductor testing.

Support direct communication with the control system (main control CPU board) to complete position feedback and real-time adjustment.

Easy modular maintenance and replacement, improving equipment maintainability and upgradability.

Multi functional interface design, strong compatibility, suitable for multiple KLA detection platforms.

Product imag

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