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  • Olympus BX-RLA2 Reflector Illuminator
  • Olympus BX-RLA2 Reflector Illuminator
  • Olympus BX-RLA2 Reflector Illuminator
Olympus BX-RLA2 Reflector Illuminator Olympus BX-RLA2 Reflector Illuminator Olympus BX-RLA2 Reflector Illuminator

Olympus BX-RLA2 Reflector Illuminator

  • Goods status: new/used
  • Delivery date: stock
  • The quality assurance period: 365 days
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Olympus BX-RLA2 Reflector Illuminator

 Introduction

Olympus BX-RLA2 Reflector Illuminator Compatible with BX51 Series Metallographic Microscope Supports Multiple Reflection Observation Modes

1. Equipped with UIS2 infinite distance correction optical imaging, clear and aberration free

2. Supports four observation methods: bright field and dark field differential interference polarization

Equipped with an adjustable field of view aperture, the aperture can be centered and calibrated

4. Equipped with a 12V100W halogen light source, the light intensity is sufficient and uniform

5. Switching between bright and dark fields, linked with neutral density filter, easy to operate

6 reserved dual filter slots for installing polarized ultraviolet attenuation filters

7 compatible with large field of view eyepiece tube compatible with FN26.5 wide field of view observation

8 external fiber optic cold light source compatible with thermal sensitive sample detection

9 built-in light path shutter for easy image capture and shading control

10 light path color difference correction, perfect brightness contrast, clear hierarchy

11. Mechanical adjustment knob with moderate damping, smooth and precise switching

12 metal precision chamber dustproof and moisture-proof, suitable for long-term laboratory use

13 Modular Disassembly and Direct Matching with BX51RF Microscope Rack

14 light intensity adjustment continuously adjustable to match different reflective samples

More than 15 are used for metallographic testing of metal semiconductor material wafers

Olympus BX-RLA2 Reflector Illuminator with Stable Optical Path and Complete Observation Modes to Meet the Requirements of Precision Material Microscopic Analysis

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