KLA Tencor 710-650074-20 Controller

KLA Tencor 710-650074-20 Controller

Product Details Introduction

KLA Tencor 710-650074-20 Controller - Product Application Fields

Product type: ZPLL controller board (Zero Phase Locked Loop)

Mainly used in: KLA Tencor 2132, 2133 wafer defect detection system

1. Defect detection of semiconductor wafers

Used for high-speed scanning detection of surface defects on wafers, especially after key process nodes such as photolithography, etching, polishing, and deposition.

Support detection tasks for 200mm and 300mm wafers.

2. Image acquisition and synchronization control

As the phase locking control core of the system, it coordinates the timing synchronization between the image acquisition module and the signal processing module.

Ensure the image stability and data accuracy of the device during high-precision sampling.

3. Clock management of high-speed detection system

Generate low-noise, high-precision synchronous clock signals.

Provide a unified timing basis for multiple key components within the system, such as sensors, motor controllers, etc.

4. Quality control and process monitoring

Suitable for quality control of 90nm, 65nm and more advanced process nodes.

Widely used for process stability analysis and yield improvement in manufacturing processes such as logic chips, DRAM, NAND, etc.

Typical usage scenarios:

Semiconductor manufacturing plants (such as TSMC, Intel, Samsung, Micron)

Process control equipment for wafer foundry and packaging testing plants

Process R&D center or testing laboratory

Product imag

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