TEL 3281-000014-16 Wafer Probe System Module

TEL 3281-000014-16 Wafer Probe System Module 

Product Introduction

TEL 3281-000014-16 Wafer Probe System Module

Product Features:

1. Adapt to TEL probe station, control the test signals between probe card and wafer

2. The signal isolation is done well, and weak test signals are not easily interfered with

3. The timing coordination between positioning and testing is stable, and the probe contact repeatability is good

4. The interface is consistent with the original, and can be repaired or replaced directly by installing it

5. Stable components, suitable for long-term continuous chip testing in clean workshops

Application fields:

6. TEL wafer probe station testing signal control

7. Chip wafer level electrical testing

8. Probe card signal conversion and acquisition

9. Semiconductor quality testing station

10. Storage chip wafer detection

11. Replacement of TEL probe equipment spare parts

12. Probe station upgrade and renovation project

13. Supporting wafer aging testing system

14. Chip testing fixture signal unit

15. Maintenance of semiconductor front-end testing equipment

The TEL 3281-000014-16 wafer probe system module is a key spare part responsible for the interaction of wafer electrical testing signals in the probe station

Product imag

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