DALSA OC-80-04K25-03 Scanning Camera Component

DALSA OC-80-04K25-03 Scanning Camera Component

 Introduction

DALSA OC-80-04K25-03 Scanning Camera Component Product Features

4K single line array CCD imaging chip, 4096 effective pixels, suitable for precision inspection of semiconductor wafer appearance

25kHz standard line scanning frequency, synchronized matching wafer transport high-speed motion, no dragging or distortion

80 μ m large photosensitive pixel size, high sensitivity, clear and uniform imaging in low light chamber environment

Built in TDI integral imaging mode, multi-stage integration improves signal-to-noise ratio, captures small scratch particle defects

Camera Link standard data interface, high-speed lossless image transmission, compatible with industrial control image acquisition cards

Support hardware pixel merging, mirroring, flat field correction, and one click elimination of uneven brightness and darkness in the image

Integrated optocoupler isolation trigger input, can be connected to pre alignment, servo encoder synchronous imaging timing

Metal fully shielded body, multi-layer EMI filtering, resistant to RF electromagnetic signal interference from etched cavities

M72 standard lens interface, can be paired with a telecentric lens to meet the requirement of distortion free imaging at the edge of the wafer

12-15V DC wide power supply, low-power operation, long-term continuous operation with low temperature rise

Multiple sets of status indicator lights on the body, visually displaying power, trigger, data transmission, and fault status

0~50 ℃ industrial wide temperature element device, clean room 7 × 24-hour uninterrupted stable image acquisition

Compact integrated structure, reserved standard installation holes, can be directly integrated into wafer inspection stations

Equipped with specialized debugging software, supporting real-time online adjustment of gain, exposure, and offset parameters

Low release dust-free shell material, no dust precipitation, in compliance with semiconductor cleanroom usage standards

The DALSA OC-80-04K25-03 scanning camera component is a specialized line array vision unit for detecting wafer surface defects and edge contours. It has high imaging accuracy and strong synchronization, and is suitable for 300mm semiconductor machine vision inspection systems.

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