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  • KLA Tencor 073-805000-00 processor module
  • KLA Tencor 073-805000-00 processor module
KLA Tencor 073-805000-00 processor module KLA Tencor 073-805000-00 processor module

KLA Tencor 073-805000-00 processor module

  • Goods status: new/used
  • Delivery date: stock
  • The quality assurance period: 365 days
  • Phone/WhatsApp/WeChat:+86 15270269218
  • Email:stodcdcs@gmail.com
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KLA Tencor 073-805000-00 processor module

Product Details Introduction

KLA Tencor 073-805000-00 Processor Module - Product Application Fields Detailed Description

1. Core control unit of semiconductor testing equipment

The 073-805000-00 processor module is a key component in the KLA Tencor wafer inspection system and mask inspection equipment, responsible for the main control and data processing functions of the equipment. It is responsible for coordinating the work of multiple subsystems within the device to ensure the efficient operation of the detection process.


2. High performance data processing

This module has powerful computing capabilities and supports real-time processing of high-resolution images and sensor data collected, helping devices quickly identify defects and anomalies, and improving detection accuracy and speed.


3. Multi task collaborative control

The processor module can manage multiple control tasks simultaneously, including mechanical motion control, signal acquisition, data communication, etc., to ensure the collaborative work of various parts of the equipment and optimize the manufacturing process.


4. Support device upgrades and maintenance

As an important component of the equipment, this module design considers modularity and maintainability, facilitating equipment upgrades and rapid repairs, and improving the service life and stability of the equipment.


5. Industrial grade stability and reliability

The module complies with industrial standards and can adapt to complex environmental conditions in semiconductor manufacturing workshops, such as high temperature, dust, and electromagnetic interference, ensuring long-term stable operation of the equipment.


6. Typical Application Devices

Wafer defect detector


Mask inspection system


Surface morphology analysis equipment


Other high-precision semiconductor manufacturing testing instruments

Product imag

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6DD1607-0AA26DD1661-0AE0TRICONEX 3501E
6DD1607-0AA16DD1661-0AD1TRICONEX 3601E
6DD1607-0AA06DD1661-0AD0TRICONEX 3805H
6DD1606-4AB06DD1661-0AB1TRICONEX 3502E
6DD1606-3AC06DD1660-0BH0TRICONEX 9668-110
6DD1606-2AC06DD1660-0BG0TRICONEX 4000164-520
6DD1606-1AD06DD1660-0BF0TRICONEX 4118
6DD1606-1AC06DD1660-0BD0TRICONEX 4119


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