KLA Tencor 710-658177-20 processor module

KLA Tencor 710-658177-20 processor module

Product Details Introduction

KLA Tencor 710-658177-20 processor module

KLA Tencor 710-658177-20 is a processor control module used in wafer inspection systems, commonly found in surface defect detection equipment such as KLA Tencor's 2132/2135 series. It is mainly used to control the movement and synchronization of the X-axis in scanning systems and is one of the core components in the entire image acquisition and processing process.

Main functions:

Control the precise movement of the wafer platform in the X-axis direction;

Responsible for real-time position interpolation calculation and achieving sub micron level motion control;

Collaborate with the image acquisition system to ensure synchronous and stable detection process;

Execute core processing tasks related to motion control, position feedback, scanning timing, etc.

Application areas:

Wafer defect detection in semiconductor manufacturing;

Position control of optical and electron beam imaging systems;

The core control unit of high-precision scanning and detection platform;

The key motion control module in the KLA Tencor surface inspection system.

Product information:

Model: 710-658177-20

Type: X-Interpolator Phase 3 processor module

Installation location: located in the internal control area of the detection device host

Adaptation system: such as KLA Tencor 2132 series 200mm defect detection platform

Working mode: Coordinated operation with the main controller, encoder interface, and motion drive circuit

Product imag

Related website links

HONEYWELL 05704-A-0146 Digital

1TGE120011R1111 Controller Module

PROSOFT MVI46-MCM communicatio

Other website links

ABB 1TGE120021R0610 HW3 通信模块

IS200EROCH1ABB燃机模块

IS200DTAIH1ABB双系统监测模块