KLA Tencor 710-658051-20 processor board

KLA Tencor 710-658051-20 processor board

Product Details Introduction

The KLA Tencor 710-658051-20 processor board is mainly used in KLA Tencor's high-end wafer inspection and metrology equipment, especially in the system for high-speed and high-precision defect detection of wafer surfaces in semiconductor manufacturing processes.

1、 Product Function Overview:

This processor board is typically one of the computing core modules of the system, responsible for:

Image data acquisition and high-speed processing

The operation of defect analysis and image recognition algorithms

Collaborative communication with storage, image processing, control units, etc

Real time control and feedback logic processing

2、 Application areas:

Semiconductor Manufacturing Inspection

Applied to the middle and later stages of wafer manufacturing processes, such as post lithography inspection, post cleaning inspection, and post etching surface inspection.

Wafer defect detection system

A series of detection equipment such as AIT, e-beam, Brightfield, Darkfield, etc. are used to capture micrometer level defects on the surface of wafers.

Measurement and quality control equipment

Used as a high-speed decision analysis unit in the production line to achieve automatic defect classification (ADC) and production line feedback control.

Data intensive image analysis system

Support real-time computation of large data images to meet the processing requirements of multi-channel parallel analysis.

3、 Typical supporting system:

KLA Tencor AIT2/eS/21xx series equipment

Wafer level defect detection platform

Optical or electron beam image processing platform

Product imag

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