KLA Tencor 710-651090-20 Optical Interface Module

KLA Tencor 710-651090-20 Optical Interface Module

Product Details Introduction

KLA Tencor 710-651090-20 Optical Interface Module

product overview

The KLA Tencor 710-651090-20 optical interface module is a critical electronic component designed specifically for semiconductor wafer inspection equipment, primarily used to connect and manage optical sensors and signal processing units in optical inspection systems. This module supports high-speed and high-precision optical signal transmission and processing, ensuring accurate acquisition and stable transmission of optical detection data.

major function 

Optical signal reception and conversion

Convert optical signals from optical sensors or scanning systems into electrical signals for subsequent digital processing and analysis.

High speed data transmission

Support high-speed optoelectronic signal data transmission to ensure real-time, high bandwidth detection data transmission and improve detection efficiency.

Signal conditioning and filtering

Filter and amplify the received signal to reduce noise interference, improve signal quality and detection accuracy.

Strong interface compatibility

Supports multiple optical sensor interface standards and can flexibly integrate different types of optical components.

protection mechanism

Built in overvoltage and overcurrent protection functions ensure the safe and stable operation of modules and connected devices.

Technical Characteristics

High sensitivity optical signal receiving circuit, suitable for low light and high-speed scanning environments.

Broadband response to meet the processing requirements of optical signals with different wavelengths.

Low noise design ensures signal fidelity and improves the overall signal-to-noise ratio of the system.

Industrial grade design, suitable for high temperature, high humidity, and vibration environments.

Compact modular structure, convenient for internal integration and maintenance of equipment.

Typical application areas

Semiconductor wafer defect detection

Used for high-precision optical inspection systems, collecting and transmitting defect signals to achieve automated defect recognition.

Optical scanning system

Support data exchange between optical scanning probes and the main control unit to ensure real-time and accurate scanning process.

Imaging and measurement equipment

Cooperate with CCD or CMOS image sensors to ensure high-quality acquisition and transmission of optical signals.

Precision testing instruments

Used to connect optical components for nanoscale measurement and analysis.

Product imag

Related website links

FOXBORO FBM217 Voltage Monitor Module 

HONEYWELL 05704-A-0146 Digital

1TGE120011R1111 Controller Module

Other website links

KOLLMORGEN S22460-SRS 伺服驱动器

AMAT 0190-26370 质量流量验证器

GE IS420UCSBH1A 控制器模块