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  • KLA Tencor 0157544-004 Image Processor
  • KLA Tencor 0157544-004 Image Processor
KLA Tencor 0157544-004 Image Processor KLA Tencor 0157544-004 Image Processor

KLA Tencor 0157544-004 Image Processor

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  • Delivery date: stock
  • The quality assurance period: 365 days
  • Phone/WhatsApp/WeChat:+86 15270269218
  • Email:stodcdcs@gmail.com
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KLA Tencor 0157544-004 Image Processor

Product Details Introduction

The KLA Tencor 0157544-004 image processor module is a high-performance image processing board designed specifically for semiconductor wafer inspection equipment, mainly used to process image data from optical sensors or camera systems.


Main functions and applications

Image acquisition and preprocessing

This module can quickly collect data from CCD or CMOS image sensors and perform preliminary image preprocessing such as denoising, enhancement, and correction.


Image Analysis and Feature Extraction

Through built-in image processing algorithms, the module can recognize and extract features from images for subsequent defect detection and classification.


Data transmission and communication

The processed image data is transmitted to the main control system through a high-speed bus, supporting multiple industrial communication protocols to ensure real-time and accurate data.


System Integration and Control

The module can collaborate with other subsystems to achieve overall control and optimization of the detection equipment.


FEATURES

High performance processing capability: Equipped with advanced image processing chips, supporting high-speed image processing and analysis.


Modular design: facilitates system integration and maintenance, and adapts to the needs of different devices.


Stability and reliability: Industrial grade design, suitable for harsh working environments, ensuring long-term stable operation.


Strong compatibility: Supports multiple image sensors and communication protocols, suitable for various KLA Tencor device models.


application area 

Wafer defect detection: used to detect small defects on the surface of wafers and improve product quality.


Pattern recognition and alignment: In photolithography, precise pattern recognition and alignment are achieved.


Automated detection system: integrated into automated detection equipment to achieve high-speed and high-precision image processing.

Product imag

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