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  • KLA Tencor 720-23461-000 Wafer Inspection Tool
KLA Tencor 720-23461-000 Wafer Inspection Tool

KLA Tencor 720-23461-000 Wafer Inspection Tool

KLA Tencor 720-23461-000 Wafer Inspection Tool

Product Details Introduction

KLA Tencor 720-23461-000 Wafer Inspection Tool (ADG Board)

Product type: ADG (Analog Digital Generator) board

Manufacturer: KLA Tencor

Part number: 720-23461-000


Product application areas

Electron Beam Wafer Inspection System (E-Beam Inspection)


Applied in high-precision electron beam wafer inspection equipment, it mainly processes the analog signals received from the electron beam detector and converts them into digital signals that can be analyzed by the system.


It is a key hardware module for achieving high-resolution imaging and defect recognition.


Advanced Process Control


In 7nm, 5nm and more advanced process technologies, the detection equipment supported by this board can identify extremely small defects, improving wafer production quality and yield.


Helps to detect process fluctuations, material abnormalities, or doping deviations, improving overall process stability.


Yield Analysis of Semiconductors


By collaborating with image processing systems, precise extraction and classification of wafer surface particles, pattern defects, pressure damage, and other information are provided, providing quantitative data to support yield management and failure analysis.


Front End Process Monitoring


After key process steps such as photolithography, etching, and ion implantation, non-destructive testing is performed on the wafer to ensure that the alignment and integrity of each layer pattern meet the process requirements.


Key control modules of the detection system


As one of the core hardware components of the signal acquisition link, this module directly affects the data acquisition speed, signal processing accuracy, and image output quality of the entire machine, and is suitable for equipment maintenance and functional upgrades.

Product imag

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