KLA Tencor 710-650201-20 Base Plate Hardness Plate

KLA Tencor 710-650201-20 Base Plate Hardness Plate

Product Details Introduction

KLA Tencor 710-650201-20 Bottom Plate Hardness Plate Product Application Fields

Semiconductor wafer inspection system

As a structural support component of the equipment, it ensures the stability and precise positioning of the detection device.

Support mechanical stability requirements during wafer surface defect detection and pattern recognition processes.

Optical metrology system

Provide a sturdy and stable base plate for optical measuring instruments, ensuring accurate alignment and stable operation of optical components and scanning platforms.

Suitable for precision measurement applications such as optical interferometry and surface profile analysis.

Automated testing platform

As the core structural component of testing equipment, it enhances the overall stability of the equipment and supports efficient automated testing processes.

Helps to improve the repeatability and consistency of testing.

Equipment integration and system expansion

As the equipment chassis, ensure the mechanical stability connection between each control module and sensor.

Support the stable operation of the entire device and the integration and expansion of the system.

Product imag

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