KLA Tencor 281-600233-3 Sensor Module
Product Details Introduction
The KLA Tencor 281-600233-3 sensor module is a key component designed specifically for the KLA 1007 wafer probe station. It is mainly used to receive, process, and transmit sensor signals from various parts of the probe station, ensuring precise control and efficient operation of the equipment during wafer testing.
Main application areas
Wafer probe testing system
This sensor module is widely used in the KLA 1007 wafer probe station, responsible for collecting sensor data from various parts of the probe station to ensure precise positioning and stability of the wafer during testing.
Signal Processing and Transmission
The module is equipped with signal conditioning and conversion circuits, which convert analog signals into digital signals or perform necessary amplification and filtering processing to ensure signal quality, reduce interference, and improve system stability and reliability.
System Integration and Expansion
As part of the modular system, the 281-600233-3 sensor module provides flexible interfaces to support system expansion and upgrades, meeting different detection needs.
Equipment maintenance and replacement
As a standardized component, this module facilitates quick replacement and upgrade by equipment maintenance personnel, reducing equipment downtime and improving production efficiency.
technical specifications
Interface type: Supports multiple interface standards to ensure compatibility with other modules.
Function: Signal acquisition, processing, and transmission.
Compatibility: Compatible with various detection systems of KLA Tencor.
Product imag

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