KLA Tencor 710-102570-02 Optical Interface Module

KLA Tencor 710-102570-02 Optical Interface Module

Product Details Introduction

The KLA Tencor 710-102570-02 optical interface module is an optical component used in precision detection and measurement systems, widely used in the following fields:

Semiconductor Manufacturing Equipment

Applied in optical measurement systems (such as thin film thickness and critical dimension measurement), defect detection systems, and wafer process control equipment, achieving high-precision pattern detection and process control.

Wafer Inspection and Measurement System

Used for wafer defect detection, CD SEM (critical dimension scanning electron microscope) and other systems, supporting optical signal acquisition and multi wavelength analysis functions, enhancing detection resolution and data interface capabilities.

Advanced packaging inspection

In new packaging processes such as 2.5D/3D packaging and Fan Out packaging, precision optical interface functions are implemented to ensure accurate transmission and processing of detection data.

OEM Optoelectronic System Integration

Used in customized automatic optical inspection (AOI), laser scanning systems, and high-end alignment equipment to provide stable optical communication and control support for the devices.

Research and industrial testing applications

Used in high-resolution imaging, microstructure detection, and visual recognition systems in microelectronics, material analysis, and precision measurement laboratories.

Product imag

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