TEL LST-1 3281-000147-17 main control board

TEL LST-1 3281-000147-17 main control board 

Product Introduction

TEL LST-1 3281-000147-17 main control board

Product Features

1. The dedicated main control unit for wafer testing equipment is responsible for the overall process logic calculation and fast instruction scheduling processing speed.

2. Onboard hardware signal isolation design, anti electromagnetic interference, suitable for complex and clean working conditions inside the probe station cabinet.

3. Standard card slot installation, integrated fault self checking circuit, easy replacement of spare parts, shortening downtime for maintenance.

Application Fields

1. TEL P-8 Fully Automatic Wafer Probe Station System

2. Semiconductor wafer electrical testing equipment

3. Chip probe detection main control system

4. Wafer stage motion logic control unit

5. Probe card signal acquisition and processing module

6. Semiconductor yield testing equipment

7. Automatic wafer loading and unloading control system

8. Microelectronics Device Testing Platform

9. Semiconductor Clean Testing Fixture

10. Precision chip sorting and testing equipment

Product Specifications

1. Support internal dedicated bus of the device, which can communicate and link with various IO boards and motion boards.

2. The working temperature is 0-50 ℃, and it operates stably in a clean environment without condensation for a long time.

3. Onboard multi-channel digital signal interface with power on self-test and fault code output functions.

The TEL LST-1 3281-000147-17 main control board is the core control board of the wafer probe station, which coordinates equipment movement, signal acquisition, and testing processes to ensure stable execution of semiconductor wafer electrical testing operations.

Product imag

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