Olympus IX71S1F-3 Robot Controller

Olympus IX71S1F-3 Robot Controller        

Product Details Introduction

Olympus IX71S1F-3 Electric Microscopy Imaging Control Unit Product Features

Olympus IX71S1F-3 is an integrated electronic control base for Olympus fully automatic inverted fluorescence microscope, which integrates stage, optical path, and shutter motion control. It is commonly used for semiconductor wafer micro inspection and material micro analysis equipment matching.

Original factory UIS infinite distance optical rack, with a rigid body and no offset in the optical path under temperature changes

Equipped with electric XY/Z three-axis stage, nanometer level focusing and repetitive positioning accuracy

Integrated electronic control, filter wheel, fluorescent shutter, objective lens switching drive

Low vibration silent servo drive, high-speed movement without damaging the surface of the wafer sample

Multi channel fluorescence light path control, supporting automatic switching of multi band excitation

Front facing physical operation buttons, paired with upper level software for dual-mode control

Digital signal closed-loop feedback, real-time feedback of carrier coordinates and optical path status

Standard serial/network communication, integrated with the main control of the testing machine for imaging linkage

Multiple hardware protections: automatic shutdown and locking for overtravel, overload, and overheating

Anti static coating for the whole machine, suitable for use in dust-free wafer testing stations

Power off to save focus coordinates and optical path parameters, restart without recalibration

Layered multi-channel isolation circuit, shielding equipment from radio frequency electromagnetic signal interference

Modular electric components, carrier and optical drive unit can be replaced separately

High signal-to-noise ratio fluorescence optical path design, no impurities in micro defect imaging

Compatible with various sample carrier specifications such as culture dishes, wafers, and glass slides

OLYMPUS IX71S1F-3 is a core imaging control machine for semiconductor appearance inspection and material microscopic analysis, achieving fully automatic high-precision microscopic scanning inspection.

Product imag

ontroller Module

Motorola MVME2400-0361 Single Board Computer
SEIFERT 3BHB022684R0101 driver module
Bently 149992-01 Relay Module

Other website links

PFTL301E 3BSE019050R1000 1.0kN 压力传感器
A30-30-10RT接触器
Bently 3500/15E 164949-01电源模块