Olympus DUV-KIT-2-2 microscope lens
Product Details Introduction
Olympus DUV-KIT-2-2 microscope lens
Introduction: Olympus DUV-KIT-2-2 is a deep ultraviolet lens kit specifically designed for semiconductor wafer inspection, compatible with Olympus MX series industrial microscopes for observing small defects.
Suitable for 248nm deep ultraviolet band, with higher resolution for shortwave imaging
Using quartz specific optical lenses with high UV transmittance
Glueless lens structure, long-term UV irradiation does not age or peel off
Full path color difference correction, no distortion or blur at the edges of the image
Large numerical aperture design, capable of capturing nanoscale fine patterns
Long short focal length matching kit, balancing large-scale scanning and fine observation
Standard universal mount, directly matched with Olympus inspection microscope
The lens casing is dust-proof and corrosion-resistant, suitable for dust-free workshop environments
Low reflective coating, reducing stray light interference, high imaging contrast
Short working distance, close observation of wafer surface patterns
Anti UV aging material, long-term performance does not deteriorate
Paired with a UV light source module, allowing for free switching between bright and dark field observations
Adapt to automatic stage and support large-area wafer inspection
Factory optical calibration ensures stable measurement accuracy of imaging dimensions
Modular assembly, easy and convenient disassembly and cleaning of lenses
Conclusion: Olympus DUV-KIT-2-2 has clear and durable imaging, and is a core optical component for semiconductor lithography and wafer defect detection.
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