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  • THERMO NORAN 700P135927 Microanalysis System
  • THERMO NORAN 700P135927 Microanalysis System
THERMO NORAN 700P135927 Microanalysis System THERMO NORAN 700P135927 Microanalysis System

THERMO NORAN 700P135927 Microanalysis System

THERMO NORAN 700P135927 Microanalysis System 

Product Details Introduction

THERMO NORAN 700P135927 Microanalysis System Product Features

Introduction: THERMO NORAN 700P135927 is a micro area analysis and control system that is compatible with AMAT semiconductor detection equipment. It has precise trace element detection and strong integration adaptability. Its core features are as follows:

Equipped with a dedicated ADSP digital signal processing board, it has high sensitivity for collecting trace X-ray signals

Integrated multiple MADC analog-to-digital conversion channels, low loss conversion of trace sample signals

Standard matching AMAT SemVision cX detection equipment, plug and play, no need for modification

100-120V wide voltage supply, stable and continuous operation under voltage fluctuations on the production line

Multi layer isolated PCB circuit, resistant to electromagnetic interference from semiconductor devices, baseline drift free

Built in real-time fault self check, quick indicator light prompt for abnormal power and signal channels

Support EDS detector signal access to achieve qualitative and quantitative analysis of trace elements at the nanoscale

Equipped with high-speed Ethernet communication, real-time upload of trace analysis data to the production line central control

Metal sealed modular structure, dustproof and moisture-proof, suitable for dust-free testing workshop environment

Built in PROZA matrix correction algorithm significantly reduces errors in trace component analysis

Compatible with multiple micro scanning modes such as point, line, and surface, for comprehensive detection of sample micro areas

Large capacity local storage, retaining a large amount of trace detection raw spectral data

Hardware modular plugging and unplugging design, quick replacement of a single faulty board, shortening downtime

Equipped with SpectraCheck peak shape calibration and automatic identification of overlapping trace element peaks

Low power constant temperature operation, long-term micro analysis without temperature offset affecting accuracy

Conclusion: In summary, THERMO NORAN 700P135927 is a core supporting system for micro component micro detection of wafers, which combines high-precision micro detection, semiconductor equipment adaptation, and convenient maintenance.

Product imag

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